JPH0738868Y2 - Ｉｃの温度試験用断熱ケース - Google Patents
Ｉｃの温度試験用断熱ケースInfo
- Publication number
- JPH0738868Y2 JPH0738868Y2 JP1989134588U JP13458889U JPH0738868Y2 JP H0738868 Y2 JPH0738868 Y2 JP H0738868Y2 JP 1989134588 U JP1989134588 U JP 1989134588U JP 13458889 U JP13458889 U JP 13458889U JP H0738868 Y2 JPH0738868 Y2 JP H0738868Y2
- Authority
- JP
- Japan
- Prior art keywords
- case
- test
- temperature test
- socket
- lid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 33
- 238000009413 insulation Methods 0.000 title claims description 3
- 239000007789 gas Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989134588U JPH0738868Y2 (ja) | 1989-11-20 | 1989-11-20 | Ｉｃの温度試験用断熱ケース |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989134588U JPH0738868Y2 (ja) | 1989-11-20 | 1989-11-20 | Ｉｃの温度試験用断熱ケース |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0372376U JPH0372376U (en]) | 1991-07-22 |
| JPH0738868Y2 true JPH0738868Y2 (ja) | 1995-09-06 |
Family
ID=31681914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989134588U Expired - Fee Related JPH0738868Y2 (ja) | 1989-11-20 | 1989-11-20 | Ｉｃの温度試験用断熱ケース |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0738868Y2 (en]) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009097968A (ja) * | 2007-10-16 | 2009-05-07 | Akim Kk | 温度特性計測装置および温度特性計測方法 |
| JP5604413B2 (ja) * | 2011-12-20 | 2014-10-08 | シャープ株式会社 | バーンイン装置 |
| WO2020188792A1 (ja) * | 2019-03-20 | 2020-09-24 | 日新ネオ株式会社 | 電子部品試験装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5619767U (en]) * | 1979-07-24 | 1981-02-21 | ||
| JPS63115074A (ja) * | 1986-10-31 | 1988-05-19 | Mitsubishi Electric Corp | 半導体高温加速試験装置 |
-
1989
- 1989-11-20 JP JP1989134588U patent/JPH0738868Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0372376U (en]) | 1991-07-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |